CCD3 tests 19-Mar-98


Aim

CCD3 amplifier A stopped operating. Focal plane FP3 was rewired to enable readout from amplifiers C & D and the chip reinstalled. Amplifier C & D are to be tested.


Setup

CCD3 Site 1752x532 in dewar 3 connected to SDSUI controller running cicada V2-0b16. The dewar is connected to test box. The CCD was operated at 170K and is setup to read out from amplifiers C and D


Amplifier D Results

Drive Setup

Bias Voltages

FVOFFSET+1.5; +1.5 Video Processor output offset
FVOD+24.0; +24.0 Output Drain
FVRD+13.5; +13.5 Reset Drain
FVBIAS3+0.1; +0.0 VBIAS3
FVOG-3.5; -3.5 Output Transfer Gate
FVBIAS5+0.0; +0.0 VBIAS5
FVABG-7.0; -7.0 VABG
FVBIAS6+0.0; +0.0 VBIAS6
FVABD-7.0; -7.0 VABD
FVBIAS7+0.0; +0.0 VBIAS7

Clock Voltages

FVS_LO-6.0Serial low
FVS_HI+4.0Serial high
FVP_LO-7.8Parallel low
FVP_HI+2.0Parallel high
FVRG_LO+0.0Reset low
FVRG_HI+12.0; Reset high
FVS1_LOFVS_LO; Serial 1 low
FVS1_HIFVS_HI; Serial 1 high
FVS2_LOFVS_LO; Serial 2 low
FVS2_HIFVS_HI; Serial 2 high
FVS3_LOFVS_LO; Serial 3 low
FVS3_HIFVS_HI; Serial 3 high
FVSW_LO-6.0Summing Well low
FVSW_HI+5.0Summing Well high
FVP1_LOFVP_LO; Parallel 1 low
FVP1_HIFVP_HI; Parallel 1 high
FVP2_LOFVP_LO; Parallel 2 low
FVP2_HIFVP_HI; Parallel 2 high
FVP3_LO-10.5Parallel 3 low
FVP3_HI+5.5Parallel 3 high
FVTG_LO-10.5Transfer Gate low
FVTG_HI+5.5Transfer Gate high

The parallel clocks were run in MPP mode.

Gain and Noise

The following images were taken to measure Gain and Noise.

Images
Type
Exposure Times (secs)
Comment
noise0001.fits bias0
noise0002.fits bias0
noise0003.fits flat2~ 10000 ADU
noise0004.fits flat2~ 10000 ADU
noise0005.fits flat5~ 30000 ADU
noise0006.fits flat5~ 30000 ADU

Using IRAF script noisegain to measure noise and gain for subimage [100:120,100:120] , at 30000ADU the gain =1.2 e/ADU and noise = 4.0e­ and at 10000ADU the gain =1.2 e/ADU and noise = 3.9e­

Dark Current

The following images were taken to measure dark current

Images
Type
Exposure Times (secs)
Comment
dark_170_0001.fits dark0
dark_170_0002.fits dark400
darkdiff.fits Overscan subtracted difference image

Using iraf script darkcurrent to measure dark current, an overscan subtracted difference image darkdiff.fits was generated and dark current calculated for subimage [70:90,210:230] as 0.13 e/sec/pixel. The difference image darkdiff.fits shows that the dark current varies over the chip peaking at ~ 0.3 e/pixel/sec at top center.

Conclusions

Amplifier D and the serial register appear to operate well with read noise less than 4e­. However the parallel register has serious transfer problems in the second half of the image. This problem can be reduced by decreasing parallel clock 3 low voltage to < -10V and increasing parallel clock 1 & 2 low voltages to > -8V. Increasing parallel clock 1 & 2 low voltages to > -8V, increases spurious charge, creates residual image problems etc. Since the astromed 3200 does not have the capability to set different parallel clock voltages, it was decided not to continue with this chip and to try the other engineering chip. To have a look how it operated in NONMpp mode, a test image, AmpD_NonMpp.fits was taken. This image also displays a parallel transfer problem in the second half of the chip.


Amplifier C Results

Amplifier C has serial smearing and quick adjustment of serial register and output amplifier voltages did not improve it. The bias, AmpC_Mpp_bias.fits and test pattern, AmpC_Mpp_test.fits images taken in MPP mode shows the same parallel lines observed with amplifier D. Due to lack of time, this amplifier was not pursued any further.